CEITEC and CMI Collaborate to Enhance High-Speed Microscopy Capabilities
CEITEC and the Czech Metrology Institute aim to increase high-speed atomic force microscopy measurement speeds by up to five times over three years. This project will integrate AI algorithms for improved data analysis, impacting biological research and semiconductor quality control.
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The GAČR project focuses on enhancing high-speed atomic force microscopy through optimized scanning techniques, aiming for a fivefold increase in measurement speed. CEITEC Brno University of Technology will develop new scanning patterns while the Czech Metrology Institute will conduct experimental measurements.
The project addresses challenges in capturing rapid changes in samples, particularly in biological contexts, where traditional methods may miss critical details. The new methodology is expected to facilitate real-time imaging and evaluation in industrial applications, particularly within semiconductor production lines. Additionally, CEITEC is also involved in the European DINAMO project, which aims to standardize data-processing methods for scanning probe microscopes.
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