University of Warwick Secures Funding for Wide-Bandgap Semiconductor Testing System

The University of Warwick has obtained funding to enhance the UK's testing capabilities for wide-bandgap semiconductors, crucial for electric vehicles and renewable energy. The funding will facilitate the acquisition of a dynamic reliability tester from ipTEST Ltd, enabling extreme testing conditions for next-generation semiconductor devices. This initiative aims to establish a comprehensive reliability database and support UK manufacturers, particularly smaller companies, in improving device performance and innovation.

Published Mar 21, 2026

The University of Warwick has secured funding to improve the UK's capacity for testing wide-bandgap (WBG) power semiconductors, essential for electric vehicles and renewable energy. The funding will be used to purchase a dynamic reliability and robustness tester from ipTEST Ltd, allowing researchers to subject advanced semiconductor devices to extreme conditions.

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This equipment will help create a comprehensive reliability database for silicon carbide (SiC) and gallium nitride (GaN) materials, enhancing the UK's testing capabilities, particularly for smaller companies. The system will be operational by April and accessible to both academic and industry users.