Article

A study by engineers from Duke University reveals that the performance of 2D semiconductors has been significantly overestimated due to systematic measurement errors in standard testing methods. The 'contact gating' phenomenon alters the properties of materials under metallic contacts, leading to inflated performance metrics, with results up to six times higher than real-world conditions.

This affects the viability of incorporating 2D materials into next-generation processors, crucial for Spain's microelectronics strategy under projects like PERTE Chip. To address this, new design rules must be established, focusing on reducing contact lengths and validating alternative metals for effective integration.