Northrop Grumman Develops Compact Testing for Radiation-Hardened Microelectronics
Northrop Grumman has developed a compact testing environment for radiation-hardened microelectronics as part of DARPA's ASSERT program, significantly reducing testing time from years to months. This innovative technology, created in collaboration with Vanderbilt University and the Lawrence Berkeley National Laboratory, simulates extreme radiation conditions and enhances capabilities for space and nuclear applications, ultimately supporting the American supply chain for defense and commercial systems.
Theia Market Signal Identification - AI Assisted
Northrop Grumman Corporation has developed a secure testing environment for radiation-hardened microelectronics under DARPA's ASSERT program, reducing testing time from years to months. The technology enables testing in a compact laboratory setting and simulates extreme radiation conditions.
Northrop Grumman is collaborating with Vanderbilt University and the Lawrence Berkeley National Laboratory to utilize laser plasma accelerator technology. This innovation allows for testing of advanced microelectronics, enhancing capabilities for space and nuclear applications. The program aims to improve testing efficiency and support the American supply chain for defense and commercial systems.
Comments