Northrop Grumman Develops Compact Testing for Radiation-Hardened Microelectronics
Northrop Grumman Corporation has developed a secure testing environment for radiation-hardened microelectronics under DARPA's ASSERT program, reducing testing time from years to months. The technology enables testing in a compact laboratory setting and simulates extreme radiation conditions.
Northrop Grumman is collaborating with Vanderbilt University and the Lawrence Berkeley National Laboratory to utilize laser plasma accelerator technology. This innovation allows for testing of advanced microelectronics, enhancing capabilities for space and nuclear applications. The program aims to improve testing efficiency and support the American supply chain for defense and commercial systems.
