Bruker and imec Collaborate on Advanced AFM-IR for Semiconductor Applications
Bruker Corporation is enhancing photothermal AFM-IR spectroscopy through a partnership with imec, targeting semiconductor research. The collaboration aims to improve nanoscale chemical characterization critical for developments in EUV photoresist and materials for transistor scaling.
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Bruker Corporation has partnered with imec to advance photothermal AFM-IR spectroscopy, specifically the Dimension IconIR system, to improve nanoscale chemical characterization in semiconductor research. This initiative will focus on EUV photoresist development and materials for transistor scaling, providing insights unattainable by conventional methods.
This collaboration is expected to support the development of next-generation semiconductor devices by overcoming existing analytical challenges. The impact of these advancements could significantly enhance material understanding, potentially leading to innovations in semiconductor technology.
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